Custom AOTF-NIR Spectrometers
Brimrose develops custom AOTF‑NIR spectrometers for applications that need performance or design options not available in standard models. Each system is built for the specific needs of the application, such as the optical setup, wavelength range, and interface options, along with other specialized requirements. These solutions provide the performance and features required for more advanced needs.
AOTF-NIR Technology
Brimrose Acousto‑Optic Tunable Filter (AOTF) technology is the core of our AOTF‑NIR spectrometers. This solid‑state design enables fast and stable wavelength selection, supporting reliable measurements in laboratory, at‑line, and especially in‑line process environments. For a more detailed look at how AOTF and AOTF‑NIR technology work, explore our full AOTF‑NIR technology overview.
Built‑for‑Purpose AOTF‑NIR Models
Luminar 3076
SeedMeister NIR Spectrometer
The Luminar 3076 is developed for non‑destructive, 100% seed analysis and sorting. It employs our AOTF‑based NIR technology to deliver fast, wavelength‑accurate measurements ideal for high‑throughput seed evaluation, measuring key properties such as oil, protein, and moisture across major hybrid seed classes such as corn, soybeans, and peanuts.
Luminar 3070
Benchtop NIR Spectrometer
The Luminar 3070 brings the advantages of AOTF‑NIR technology—typically associated with in‑line or at‑line systems—into an easy-to-use benchtop configuration. It supports dry measurements using a rotating‑dish reflectance setup for powders, granules, and tablets with minimal preparation; liquid measurements through a flow‑cell that works well with larger or less uniform materials; and transmission measurements for tablets and small seeds using an integrated detector arm. The 3070 is also naturally resistant to ambient light, making operation simple and realiable in everyday production or QC environments.
Luminar 4020
On‑Line Thin‑Film NIR Spectrometer
The Luminar 4020 is designed to measure multiple layers of thin films individually and eliminates the need to measure substrate thickness for accurate measurement of coating weight. Coating‑weight measurement and residual solvent levels are routinely performed with this high‑speed on‑line analyzer, which uses AOTF‑based NIR technology and can be mounted on a traveler to scan across the web or operated in a fixed, static position.
